Data Supporting "Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance", AIP Advances 5, 127108 (2015)

Mustafa Tokac, Mu Wang, Samridh Jaiswal, Andrew Rushforth, Bryan Gallagher, Del Atkinson & Aidan Hindmarch
(Abstract from article) We have studied in-plane anisotropic magnetoresistance(AMR) in cobaltfilms with overlayers having designed electrically interface transparency. With an electrically opaque cobalt/overlayer interface, the AMR ratio is shown to vary in inverse proportion to the cobaltfilm thickness; an indication that in-plane AMR is a consequence of anisotropic scattering with both volume and interfacial contributions. The interface scattering anisotropy opposes the volume scattering contribution, causing the AMR ratio to diminish as the cobaltfilm thickness is...
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