Research data for "Nanoscale depth-resolved polymer dynamics probed by the implantation of low energy muons"

Tom Lancaster, Francis Pratt, Peter Baker, Stephen Blundell, Thomas Prokscha, Elvezio Morenzoni, Andreas Suter & Hazel Assender
The low energy muon (LEM) technique has been used to probe local changes in the dynamical spectrum of thin film polymer samples taking place as a function of the temperature and the implantation depth below the free surface. The studies have been made on samples of polydimethylsiloxane (PDMS) and polybutadiene (PB) using the transverse magnetic field (TF) configuration and diamagnetic probe muons. In PDMS evidence is found for suppression of the glass transition temperature near...
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