Data from "Spectroscopic detection of atom-surface interactions in an atomic vapour layer with nanoscale thickness"

K.A. Whittaker, J. Keaveney, A. Sargsyan, D. Sarkisyan, I.G. Hughes & C.S. Adams
Abstract from article: We measure the resonance line shape of atomic vapor layers with nanoscale thickness confined between two sapphire windows. The measurement is performed by scanning a probe laser through resonance and collecting the scattered light. The line shape is dominated by the effects of Dicke narrowing, self-broadening, and atom-surface interactions. By fitting the measured line shape to a simple model we discuss the possibility to extract information about the atom-surface interaction.
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