Measurement of finite-frequency current statistics in a single-electron transistor

Niels Ubbelohde, Christian Fricke, Christian Flindt, Frank Hohls & Rolf J. Haug
Electron transport in nanoscale structures is strongly influenced by the Coulomb interaction that gives rise to correlations in the stream of charges and leaves clear fingerprints in the fluctuations of the electrical current. A complete understanding of the underlying physical processes requires measurements of the electrical fluctuations on all time and frequency scales, but experiments have so far been restricted to fixed frequency ranges, as broadband detection of current fluctuations is an inherently difficult experimental...
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