Data for Atomic Resolution Convergent Beam Electron Diffraction Analysis Using Convolutional Neural Networks

Chenyu Zhang, Jie Feng, Luis Rangel DaCosta & Paul M. Voyles
Simulated and experimental 4D STEM data sets acquired from SrTiO3 [100] as a function of thickness. Convolutional neural networks trained to determine the sample thickness from 4D STEM data.
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