Data for Correlation Symmetry Analysis of Electron Nanodiffraction from Amorphous Materials

Shuoyuan Huang, Carter Francis, Jittisa Ketkaew, Jan Schroers & Paul M. Voyles
Data for "Correlation Symmetry Analysis of Electron Nanodiffraction from Amorphous Materials" by Shuoyuan Huang, Carter Francis, Jittisa Ketkaew, Jan Schroers, Paul M. Voyles. Data consist of experimental electron nanodiffraction patterns from metallic glasses. Experimental data were collected on Pd40Ni10Cu27P20 metallic glass nanowires with a 2 nm diameter, 200 kV electron probe beam on a Titan STEM using a Gatan US1000 CCD camera. The nanowires were 41 ± 3 nm thick. Jupyter notebooks demonstrate analysis of...
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