Gate - A Genetic Algorithm for Compacting Randomly Generated Test Sets

J Aylor, J Cohoon, E Feldhousen & B Johnson
A new technique. named GATE. is presented for the generation of compact test sets. GATE combines a previously proven method for random test pattern generation with the adaptive searching capabilities of genetic algorithms to produce very high quality test sets. A series of experiments demonstrated that our technique performed consistently better than the traditional method with respect to both fault coverage and test set size. 1‘ This research was supported in part by the Virginia...
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