RESULTS OF THE SURFACE MORPHOLOGY STUDY OF ELASTIC SELF-ADHESIVE RADIATION SHIELDING COATINGS BY ATOMIC FORCE MICROSCOPY

M.E. Buzoverya, Yu.P. Scherbak, V.D. Cherkasov, Yu.V. Yurkin, V.V. Avdonin, D.L. Suntsov & V.O. Pilshchikov
An algorithm for studying the structure of radiation shielding materials using the atomic force microscopy (AFM) method has been developed and described. Using the proposed method, the structure of tungsten-containing radiation shielding materials was studied and the difference in the microstructure of the samples and the nature of the distribution of the filler was revealed.
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