In-field structural methods for end-to-end automotive digital diagnosis

Alejandro Cook
The automotive domain has strongly relied on recent advances in semiconductor technology in order to offer customers a huge amount of appealing features of overwhelming complexity. As traditional functional tests are no longer sufficient to fulfill automotive diagnostic requirements, the analysis of automotive semiconductor failures has become a major quality concern. Semiconductor structural test solutions are already key technologies for the successful manufacturing of any integrated circuit. However, these techniques place stringent constraints on the...
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