Microstructural characterization of yttria-stabilized zirconia thermal barrier coatings grown on sapphire substrates

Boryana Rashkova
The present work systematically addresses, for the first time, the characterization of interfaces between thermal barrier coatings (TBCs) and the underlying thermally grown aluminum oxide (TGO) using a model system comprising yttria-stabilized zirconia (YSZ) deposited by electron-beam physical vapor deposition (EB-PVD) on basal plane sapphire. The results provide new insight into the initial stages of TBC growth and especially on the development of texture and the influence of crystallographic orientation relationships at the YSZ/sapphire interface....
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