Yields of multicharged ions scattered and recoiled from a clean silicon surface.

Pierre. Gauthier
This thesis investigates the basic interactions of energetic ions with the top atoms on a clean surface. This information is of relevance to impact collision ion scattering spectroscopy (ICISS) investigations of surface structure. Using a variety of ions with energies in the keV range e.g. C$\rm\sp+,\ N\sp+,\ O\sp+,\ F\sp+,\ Ne\sp+,\ P\sp+,\ S\sp+,\ Cl\sp+$ and Ar$\sp+,$ incident upon a clean amorphous silicon surface, the outgoing particles were found to contain a significant fraction of multiply charged...
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