Reliability and availability analysis of three-state device systems.

Jun. Pu
This study presents the reliability and availability analysis of three-state device systems with common-cause failures. The effect of common-cause failures on different systems is discussed. Different configurations are compared in order to obtain higher standby system reliability. Mathematical expressions are developed for the system reliability, the mean time to failure, the steady state availability and the time dependent availability of cold standby system, warm standby system, series system and parallel system. For system with constant...
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