Replication Data for: Hot Carriers Perspective on the Nature of Traps in Perovskites

Marcello Righetto, David Giovanni, Swee Sien Lim, Melvin Jia Wei Lim, Qiannan Zhang, Sankaran Ramesh, Eugene Yong Kang Tay & Tze Chien Sum
The defects in lead halide perovskites are usually regarded benign to their optoelectronic properties but it remains a question to what extent. Here Righetto et al. quantify how hot carriers experience increased trapping rates at the defects, making them less benign and develop a strategy to passivate them.
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