High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method

H. J. Bunge, H. Klein, L. Wcislak, U. Garbe, W. Weiß & J. R. Schneider
In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g={?1F?2} must be known in all points x={x1?x2?x3} of the material. This can be achieved by locationresolved diffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution in the orientation- as well as the location-coordinates can be achieved by three variants of a detector sweeping technique in which an area detector is continuously moved during exposure. This technique results in...
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