Measurements of radiation damage on silicon sensors

J.L. Agram, W. Barter, M. Baselga, M. Battaglia, J. Beyer, H.M. Borecka-Bielska, D. Brzhechko, P. Collins, A. De Cosa, I. Dawson, F. Djama, F. Feindt, A. Grummer, M. Hoeferkamp, J. Hunt, T. Kondo, V. Lima, A. Macchiolo, J. Llorente Merino, K. Mochizuki, B. Nachman, G. Sarpis, S. Seidel, J. Sonneveld, S. Tsuno … & R. Wang
This chapter is organized as follows. Section 5.1 introduces, for each experiment, aspects of the detector set-up and measurement methods particularly relevant for the measurements. Next, the models used to interpret the data are summarized in Section 5.2. Then, in Section 5.3, we present the measurements for the above observables. The chapter ends with discussion and outlook in Section 5.4.
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