Angle-scanned photoelectron diffraction

J. Osterwalder, P. Aebi, R. Fasel, D. Naumovic, Patrick Schwaller, T. Kreutz, L. Schlapbach, T. Abukawa & S. Kono
A brief survey is given on the current state-of-the-art of this surface structural technique based on photoelectron spectroscopy, with particular emphasis on the progress that has been made recently by routinely measuring full-hemispherical intensity distributions. We limit the discussion to the hotoelectron forward focusing regime, which is attained at electron kinetic energies of a few hundred eV. Surface bond directions are directly revealed as pronounced maxima in the angular distributions from subsurface atoms, while characteristic...
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