Using AFM to find evidence of conformal monolayers

Erich Meinig, Thomas Brenner, Gang Chen, Reuben Collins & Thomas Furtak
Atomic force microscopy (AFM) is one of the tools used to infer whether a conformal monolayer of the surface treatment exists. AFM roughness measurements can be used to detect changes in height before and after surface treatment. This work aimed to measure the existence of such layers.
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