Coplanar and grazing incidence x-ray-diffraction investigation of self-organized SiGe quantum dot multilayers

V. Holý, A. A. Darhuber, J. Stangl, S. Zerlauth, F. Schäffler, G. Bauer, N. Darowski, D. Lübbert, U. Pietsch & I. Vávra
Physical review / B 58(12), 7934 - 7943 (1998). doi:10.1103/PhysRevB.58.7934
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