Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy

Shigeo Tanuma, Hideki YOSHIKAWA, Hiroshi SHINOTSUKA & Ryuichi Ueda
We have calculated mean escape depths (MEDs, D) of photoelectrons from Si, Cu, and Au excited by linearly polarized X-rays over the 50 to 10,000 eV energy range for high -energy photoelectron spectroscopy. These calculations were done with Monte Carlo methods using the values of electron inelastic mean free paths λ that were calculated by the relativistic full Penn algorithm and the Dirac-Hartree-Fock atomic potential for elastic scattering of electrons. In order to know the...
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