Data from: Quantification and optimization of ADF-STEM image contrast for beam sensitive materials

Karthikeyan Gnanasekaran, Gijsbertus De With & Heiner Friedrich
Many functional materials are difficult to analyze by Scanning Transmission Electron Microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated, a situation that is common for materials that are ordered from the nanometer to micrometer length scales or when performing dynamic experiments in a TEM liquid cell. Here we report a method to optimize annular dark-field (ADF)...
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