O4.2 - Thin-Film Measurements with Short Pulse Terahertz Radiation

J. Jonuscheit, F. Ellrich, M. Theuer, G. Torosyan & R. Beigang
The potential of short terahertz pulses for thin-film measurements of materials opaque in the visible range is demonstrated. Layer thicknesses down to 10 µm have been determined in reflection measuring mode and complex multilayer structures in the subwavelength range have been resolved with this technique.