P1.1 - A novel measuring system for the metrological characterization of piezoresistive films at high temperature

Damiano Crescini & Marco Romani
In different industrial applications, such as injection molding and/or hot rolling, it is necessary to measure pressure in critical environmental conditions at high temperature. A promising approach for high temperature applications is the use of a wide band gap semiconductor such as silicon carbide (SiC). The excellent electrical and mechanical properties as temperature far beyond 350°C make it a suitable material for electromechanical sensors in high temperature application. The purpose of this work was to...