P4.3 - Integrated System Scanning Probe Microscope - Quartz Microbalance: in-situ Testing of Surface Potential, Topography and mass of the adsorbed gases.

V. S. Popov, R. G. Pavelko, V. G. Sevastynov, N. T. Kuznetsov & N. S. Kurnaakov
In-situ measurements of electron workfunction together with mass registration of the analyte, adsorbed on the semiconductor surfaces, provide promising tool for better understanding of surface processes related with gas sensor phenomenon. In this study scanning probe microscope (SPM, Solver ProM, NT-MDT, Russia) was used both in contact and Kelvin probe mode to measure surface topography and potential of SnO2 materials deposited on quartz microbalance (QMB, MP3QCM, NT-MDT, Russia). QMB resonator, being easily replaceable element of...