Multi-Material Acceptance Testing for Computed Tomography-Based Coordinate Measurement Systems

Fabricio Borges de Oliveira
X-ray computed tomography (CT) is regarded by many as the third revolution in coordinate metrology. This may be explained by the holistic approach of CT, which scans workpieces completely and allows a great variety of measurements. With a single scan, it is possible to make for example, dimensional, form or wall thickness measurements, or even to compare the entire workpiece with e.g. its nominal geometry, and more. The same holistic approach also greatly facilitates the...
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